- sample beam
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English-Ukrainian analytical chemistry dictionary. 2013.
English-Ukrainian analytical chemistry dictionary. 2013.
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Sample Preparation Equipment — refers to equipment used for the preparation of physical specimens for subsequent microscopy or related disciplines including failure analysis and quality control. The equipment includes the following types of machinery:* Precision cross… … Wikipedia
Focused ion beam — Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor and materials science fields for site specific analysis, deposition, and ablation of materials. The FIB is a scientific instrument that resembles a… … Wikipedia
Laser beam profiler — A laser beam profiler captures, displays, and records the spatial intensity profile of a laser beam at a particular plane transverse to the beam propagation path. Since there are many types of lasers ultraviolet, visible, infrared, continuous… … Wikipedia
Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… … Wikipedia
Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… … Wikipedia
Optical beam induced current — (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may be analyzed to determine the… … Wikipedia
Direct integration of a beam — Direct integration is a structural analysis method for measuring internal shear, internal moment, rotation, and deflection of a beam. Positive directions for forces acting on an element. For a beam with an applied weight w(x), taking downward to… … Wikipedia
Optical beam-induced currents — Optical Beam Induced Current (OBIC) is a semiconductor analysis technique that employs a scanning laser beam to induce a current flow within a semiconductor sample which may be collected and analyzed to generate images that represent the sample s … Wikipedia
RFQ Beam Coolers — RFQ stands for Radio Frequency Quadrupole (also known as a Quadrupole mass analyzer when used as a mass filter), an instrument that is used in mass spectrometry. The RFQ was invented by Prof. Wolfgang Paul in the late 50 s / early 60 s at the… … Wikipedia
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